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Xenon lamp steady-state I-V tester (component)

Product Introduction： The xenon lamp steady-state I-V tester equipment uses a xenon lamp as a steady-state light source and can be used for IV testing of crystalline silicon, perovskite, and stacked solar cells and their corresponding components. The equipment is mainly equipped with a light source control system, power control system, testing system, constant temperature system, infrared temperature probe, reference battery, computer, display, etc. The device can achieve standard I-V and V-I scanning, and has various testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage). Test parameters such as I-V curve, P-V curve, irradiance curve, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, constant voltage point current, fill factor, conversion efficiency, series resistance, parallel resistance, etc. can be obtained.

Key Parameters

Adaptation standards

IEC60904-9:2020

light source

Xenon lamp steady-state light source

Cooling method

Customized air cooling

Light source lifespan

1000h

spectral range

300-1200nm

Spectral matching degree

AM1.5, A+level, ≤ 12.5% (based on 1000W/㎡, compliant with IEC60904-9:2020)

Non-uniformity of irradiation

A+level, ≤ 2% (based on 1000W/㎡, compliant with IEC60904-9:2020)

Irradiation instability

A+level, ≤ 1% (based on 1000W/㎡, compliant with IEC60904-9:2020)

Range of irradiance

200W/㎡~1200W/㎡

test area

?1200*600mm
?Customizable in other sizes

Test mode

The steady-state test mode can be freely set from 1 second to continuous illumination

Multi-channel Design

36 channels can be tested simultaneously, and the number of channels can be customized

Test technology

Equipped with I-V and V-I scanning modes as standard, it has multiple testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage), which can be switched through software. At the same time, it integrates point by point scanning mode (meeting the scanning mode with a minimum step time of ≤ 0.2s)

Test battery

Polycrystalline, monocrystalline, Topcon, BC, heterojunction, CIGS, GaAs, CdTe, single junction perovskite, crystalline silicon perovskite stack, etc

Additional items that can be added

?Integrated temperature control system to achieve temperature coefficient testing
?Integrate EL testing system to achieve same workstation IV/EL testing
?Integrated IR infrared thermal imager for hot spot testing

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Key Parameters