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LED steady-state I-V tester (battery)

Product Introduction： The LED steady-state I-V tester equipment uses different types of LED bead combinations as steady-state light sources, with each type of bead independently adjustable, and can be used for IV testing of crystalline silicon, perovskite, and stacked solar cells and their corresponding components. The equipment is mainly equipped with a light source control system, power control system, testing system, constant temperature system, infrared temperature probe, reference battery, computer, display, etc. The device can achieve standard I-V and V-I scanning, and has various testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage). Test parameters such as I-V curve, P-V curve, irradiance curve, short-circuit current, open circuit voltage, peak power, peak power point voltage and current, constant voltage point current, fill factor, conversion efficiency, series resistance, parallel resistance, etc. can be obtained.

Key Parameters

Adaptation standards

IEC60904-9:2020

light source

LED combination light source, individually adjustable for each wavelength band

Cooling method

Customized water cooling

Light source lifespan

40000h

spectral range

350-1150nm, customizable for UV and IR

Spectral matching degree

AM1.5, A+level, ≤ 12.5% (based on 1000W/㎡, compliant with IEC60904-9:2020)

Non-uniformity of irradiation

A+level, ≤ 1% (based on 1000W/㎡, compliant with IEC60904-9:2020)

Irradiation instability

A+level, ≤ 1% (based on 1000W/㎡, compliant with IEC60904-9:2020)

Range of irradiance

200W/㎡-1200W/㎡

test area

?2400*1200mm
?Customizable in other sizes

Test mode

In steady-state testing mode, it can be freely set from 1 second to continuous lighting, compatible with transient testing mode

Multi-channel Design

36 channels can be tested simultaneously, and the number of channels can be customized

Test technology

Equipped with I-V and V-I scanning modes as standard, it has multiple testing technologies such as MPPT (Maximum Power Point Tracking) and I-t (Constant Voltage), which can be switched through software. At the same time, it integrates point by point scanning mode (meeting the scanning mode with a minimum step time of ≤ 0.2s)

Test battery type

Polycrystalline, monocrystalline, Topcon, BC, heterojunction, CIGS, GaAs, CdTe, single junction perovskite, crystalline silicon perovskite stack, etc

Additional items that can be added

?Customizable OBB testing fixtures and perovskite compatible fixtures
?Integrated temperature control system to achieve temperature coefficient testing

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Key Parameters