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Xenon lamp transient component I-V tester (laboratory)

Product Introduction: The xenon lamp transient component I-V tester is mainly used to simulate sunlight and collect the volt ampere characteristic curve of crystalline silicon photovoltaic cells. It generally consists of a light source system, a power supply system, an acquisition system, an infrared temperature probe, a reference battery, a display, a computer (including testing software), etc. Adopting A+A+A+class xenon lamp transient light source that meets the IEC60904-9:2020 standard, the irradiation intensity can be adjusted to 200-1200W/m2, and the equipment has temperature correction and light intensity correction functions, as well as monitoring of irradiance status. This device can be used for measuring I-V curves, P-V curves, irradiance lines, short-circuit current, open circuit voltage, peak power, peak power point voltage, current, fill factor, conversion efficiency, series resistance, parallel resistance, and other parameters of conventional polycrystalline, monocrystalline PERC, TopCon, heter

Key Parameters

  • Adaptation standards
    IEC60904-9:2020
  • light source
    Xenon lamp transient light source
  • spectral range
    300-1200nm
  • Spectral matching degree
    AM1.5, A+level, ≤ 12.5% (based on 1000W/㎡, compliant with IEC60904-9:2020)
  • Non-uniformity of irradiation
    A+level, ≤ 1% (based on 1000W/㎡, compliant with IEC60904-9:2020)
  • https://fanyi.baidu.com/translate?ext_channel=DuSearch#:~:text=Irradiation%20instability
    A+level, ≤ 1% (based on 1000W/㎡, compliant with IEC60904-9:2020)
  • Range of irradiance
    200W/㎡~1200W/㎡
  • test area
    500*500mm,Customizable in other sizes
  • pulse width
    10-100ms, adjustable in steps every 1ms
  • Repetitive accuracy
    ≤0.1%
  • Test technology
    Standard configuration includes linear scanning, advanced hysteresis algorithm, integrated successive approximation method (SAT), intelligent testing method (IAT), and peak holding test function
  • Optional
    ?EL testing system, realizing IV/EL testing at the same workstation
    ?Integrated IR infrared thermal imager for hot spot testing
    ?WPVS battery, achieving absolute measurement
  • Domestic business

    Domestic business

    Overseas Business

    Overseas Business

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